Analysis of the residual fatigue life of X70-grade pipeline steel with a semi-ellipse defect shows the maximum stress intensity factor under the influence of the flow field to be higher than the value ...
Full-blown process excursions that affect every wafer are comparatively easy for fabs to detect and fix. However, “onesie-twosie,” lower-volume excursions can go unresolved for months or even years.
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback