Analysis of the residual fatigue life of X70-grade pipeline steel with a semi-ellipse defect shows the maximum stress intensity factor under the influence of the flow field to be higher than the value ...

E-beam inspection is gaining traction in critical areas in fab production as it is becoming more difficult to find tiny defects with traditional methods at advanced nodes. Applied Materials, ASML/HMI ...

Full-blown process excursions that affect every wafer are comparatively easy for fabs to detect and fix. However, “onesie-twosie,” lower-volume excursions can go unresolved for months or even years.